Operating procedure for JEOL F High Resolution Analytical SEM. I. Specimen preparation. There are several holders for different kinds of. JEOL JSMF FEG-SEM combines an electron column with semi-in-lens detectors and an in-the- lens Schottky field emission gun, delivering ultrahigh. Your JEOL Field Emission Scanning Electron Microscope JSMF needs an active vibration isolation? We recommend Heavy Load Isolation Solutions.

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JEOL 7600F Schotky field emission scanning electron microscope

Installation Examples Installation Examples. It incorporates a large specimen chamber.

University of the Free State. The incorporation of the Gentle Beam enables top-surface imaging of a specimen at very low energies of several hundred eV. University of the Witwatersrand. University of the Western Cape. University of Fort Hare. Specifications SEI resolution 1.

High Power Optics delivers high-speed, high-precision analysis High Power Optics are adopted for the optical 76000f, providing not only high-resolution imaging, but also stably delivering high-speed, high-precision analysis, including element analysis. University of South Africa.


Cape Penninsula University of Technology. Central University of Technology. Centre for Proteomics and Genomics Research. In GB mode a bias voltage is applied to the specimen while the electron beam is emitted, allowing top-surface imaging with only several hundred eV of incident electron, making it possible to obtain high resolution images of samples that have been 7600v to observe until now.

SEM: JEOL JSMF | Electron Microscopy Center | NDSU

Dr PA Olubambi Phone: Vaal University of Technology. National Institute for Communicable Diseases. Nelson Mandela Metropolitan University. The adoption of a High Power Optics 7600 system delivers high-resolution, high-speed, high-accuracy element analysis. South African Astronomical Observatory. Tshwane University of Technology. The microscope integrates a semi in-lens system for high resolution imaging, and an in-lens thermal electron gun, both of which are a culmination of JEOL’s expertise in imaging and analysis.

University of Cape Town.

Cryo SEM – JEOL 7600F with Gatan Alto and Horiba CL Detector

Its new User Interface enables ieol navigation through imaging and analyzing procedures. Skip to main content. Semi-in-lens provides high-resolution observation and analysis High resolution observation and high spatial resolution analysis is achieved through the combination of a semi-in-lens type objective lens that can collimate the electron beam even at low accelerating voltages, and the in-lens Schottky electron source 7060f provides a stable current over a long service life.


Mesoporous silica GB in use specimen exposure energies: The JSMF is a state of-the-art thermal field emission gun scanning electron microscope. For high magnification observation.

Gentle Beam GB provides top-surface imaging with ultra-low jjeol incident electrons A Gentle Beam GB mode with better resolution than the normal mode is available. Paper filter GB in use spacimen exposure energies: Glossary of TEM Terms.

Locations Agricultural Research Council. Sefako Makgato Health Sciences University.

A semi in-lens SEM with high resolution. Durban University of Technology.